JEM’s TATF Chamber Capabilities
JEM’s Tapered Antenna Test Facility (TATF) Chamber provides powerful validation capabilities over a wide frequency range, allowing us to test antennas and antenna systems for a variety of applications. Using these tools, we are able to measure radiation patterns, antenna gain (peak, average, max linear, min linear, H and V) and axial ratio from 80 MHz to 40 GHz.
Measurement accuracy is critical, and our TATF chamber offers accuracy of peak gain measurements ± 1.0 dB from 80 to 400 MHz, ± 0.7 dB from 400 MHz to 1 GHz, and ± 0.5 dB from 1 GHz to 18 GHz. The data analysis and reduction software supports a wide range of outputs, including radiation patterns and swept gain. ASCII data files are easily processed by third party analysis tools such as MATLAB®, MathCAD® or EXCEL®
TATF Physical Setup
Rotator Plate Bolt Pattern
Plate can support up to 3,000lbs.
Testing apparatus must be 50” or less from the center of the Plate to the outside edge in order to clear the backwall during rotation.
All antennas under test must fit inside the Antenna Quiet Zone for the duration of the test. Measurement accuracy is dramatically reduced outside of the Quiet Zone.
Source Antenna Coverage
JEM uses a variety of source antennas to minimize the number of setups required per test, thereby reducing the time and expense required to get the data you need. The coverage of each of our standard source antennas is shown above on a log scale.
Many antennas can be fixtured during the allotted test time using existing structures. Custom fixturing may be required if the weight of the antenna under test is off-center by more than 36”, or if a specific mounting configuration is required. Customers have the option to design and provide their own fixtures, or JEM may design and build a custom fixture for a separate fee. To download the pdf drawing and dxf artwork of the mounting pattern, click here.
Frequently Asked Questions
Handling the Data: